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Volumn 2, Issue 4, 2012, Pages 783-803

Microscopic analysis of current and mechanical properties of nafion® studied by atomic force microscopy

Author keywords

Adhesion; AFM; Current; Model; Nafion; Nanostructure; Stiffness

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; ELECTRIC CURRENTS; MODELS; NANOSTRUCTURES;

EID: 84871631087     PISSN: None     EISSN: 20770375     Source Type: Journal    
DOI: 10.3390/membranes2040783     Document Type: Article
Times cited : (52)

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