Genetic algorithms for free-form surface matching

Proceedings - International Conference on Pattern Recognition

Volumn 4, Issue , 1996, Pages 689-693

  Brunnstrom K ^a,b   Stoddart, A J ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION; REVERSE ENGINEERING; SURFACE MEASUREMENT;

FAST SOLUTIONS; FREE-FORM SURFACE; INITIAL GUESS; ITERATIVE CLOSEST POINTS; LOCAL GRADIENTS; MODEL SURFACE; OPTIMIZATION PROBLEMS;

GENETIC ALGORITHMS;

EID: 84871627178     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.1996.547653     Document Type: Conference Paper

References (11)

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