Faster and better: A machine learning approach to corner detection

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 32, Issue 1, 2010, Pages 105-119

  Rosten, Edward ^a   Porter, Reid ^b   Drummond, Tom ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Corner detection; Feature detection

Indexed keywords

3D SCENES; CORNER DETECTION; CORNER DETECTOR; FEATURE DETECTION; FEATURE DETECTOR; FRAME RATE; HARRIS DETECTOR; HIGH QUALITY; LEARNING APPROACH; PROCESSING TIME; REAL-WORLD APPLICATION; STRINGENT TEST;

EFFICIENCY; FEATURE EXTRACTION; LEARNING SYSTEMS; THREE DIMENSIONAL COMPUTER GRAPHICS;

DETECTORS;

EID: 84871610129     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2008.275     Document Type: Article

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