Optimal semi-supervised metric learning for image retrieval

MM 2012 - Proceedings of the 20th ACM International Conference on Multimedia

Volumn , Issue , 2012, Pages 893-896

  Zhao, Kun ^a   Liu, Wei ^b   Liu, Jianzhuang ^a,c,d  

^a SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY   (China)

^b Department of Earth and Environmental Sciences   (United States)

^c CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^d HUAWEI TECHNOLOGIES CO LTD   (China)

Author keywords

image retrieval; metric learning; semi supervised learning

Indexed keywords

CONTENT-BASED IMAGE RETRIEVAL; DATA DIMENSIONS; DISTANCE METRICS; EUCLIDEAN DISTANCE; INPUT DATAS; LABEL INFORMATION; LABELED AND UNLABELED DATA; LEARNING FRAMEWORKS; METRIC LEARNING; OPTIMAL SOLUTIONS; SEMI-SUPERVISED; SEMI-SUPERVISED LEARNING; TRAINING COSTS;

CONTENT BASED RETRIEVAL; IMAGE RETRIEVAL; SUPERVISED LEARNING;

OPTIMIZATION;

EID: 84871386013     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2393347.2396340     Document Type: Conference Paper

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