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Volumn 5, Issue 2, 2012, Pages 579-589

Automated Fault Isolation of Intermittent Wiring/Conductive Path Systems Inside Weapons Replaceable Assemblies

Author keywords

[No Author keywords available]

Indexed keywords

ANNUAL COST; AUTOMATED SUPPORT SYSTEMS; AUTOMATICALLY TEST; CIRCUIT CARD; COMPONENT REPAIRS; CONDUCTIVE PATHS; DYNAMIC TESTING; FAULT ISOLATION; HIGH IMPEDANCE FAULT; NO FAULT FOUND; REPAIR COSTS; STATIC TESTS; TEST SETS; WEAPON REPLACEABLE ASSEMBLIES; WIRING FAULTS;

EID: 84871261033     PISSN: 19463855     EISSN: 19463901     Source Type: Journal    
DOI: 10.4271/2012-01-2241     Document Type: Article
Times cited : (4)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.