Lithiation-induced tensile stress and surface cracking in silicon thin film anode for rechargeable lithium battery

Journal of Applied Physics

Volumn 112, Issue 9, 2012, Pages

  Liu, Ping ^a   Sridhar, N ^a   Zhang, Yong Wei ^a  

^a INSTITUTE OF HIGH PERFORMANCE COMPUTING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGING RATE; DE-LITHIATION; FINITE ELEMENT MODELS; LITHIATION; LITHIATION PROCESS; RECHARGEABLE LITHIUM BATTERY; SHARP INTERFACE; SILICON THIN FILM; STRESS TRANSITIONS; SURFACE CRACKING; THIN FILM SURFACES; VOLUME EXPANSION;

CRACKS; FINITE ELEMENT METHOD; LITHIUM BATTERIES; SILICON; SURFACE DEFECTS; TENSILE STRESS;

THIN FILMS;

EID: 84870951273     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4764329     Document Type: Article

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