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Volumn , Issue , 2012, Pages 18-24
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Advancing high performance heterogeneous integration through die stacking
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Author keywords
[No Author keywords available]
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Indexed keywords
3-D INTEGRATION;
CHANNEL CHARACTERISTICS;
COPLANARITY;
DIE STACKING;
ELECTRICAL SIMULATION;
ELECTRONIC DESIGN AUTOMATION;
HETEROGENEOUS INTEGRATION;
HIGH BANDWIDTH;
LOW-K DIELECTRIC MATERIALS;
LOW-TEMPERATURE CO-FIRED CERAMICS;
MICRO-BUMPS;
MODELING AND ANALYSIS;
MONOLITHIC SOLUTIONS;
MULTI-CHIP;
OPTIMAL SIGNALS;
PACKAGE RELIABILITY;
PACKAGE SUBSTRATES;
TEST CHIPS;
THROUGH SILICON VIAS;
TIMING VERIFICATION;
BANDWIDTH;
CERAMIC PRODUCTS;
DIELECTRIC MATERIALS;
OPTIMIZATION;
RELIABILITY ANALYSIS;
SILICON;
THREE DIMENSIONAL COMPUTER GRAPHICS;
TRANSCEIVERS;
INTEGRATION;
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EID: 84870807894
PISSN: 19308833
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ESSCIRC.2012.6341246 Document Type: Conference Paper |
Times cited : (14)
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References (5)
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