Reliability of hybrid III-V on Si distributed feedback lasers

Conference Digest - IEEE International Semiconductor Laser Conference

Volumn , Issue , 2012, Pages 10-11

  Srinivasan, Sudharsanan ^a   Bowers, John E ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BONDED INTERFACE; CAVITY DESIGN; EPITAXIAL TRANSFER; HIGH QUALITY; HYBRID DEVICES; HYBRID SILICON; III-V ON SI; LARGE-SCALE MANUFACTURING; LOW TEMPERATURES; QUARTER WAVES; SI PHOTONICS; WAFER BONDING TECHNIQUES;

DISTRIBUTED FEEDBACK LASERS; SEMICONDUCTOR LASERS; SILICON;

RELIABILITY;

EID: 84870614120     PISSN: 08999406     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISLC.2012.6348302     Document Type: Conference Paper

References (4)

1. D. Liang and J. E. Bowers Journal of Vacuum Science and Technology B 26, 1560, 2008.
2. M. Heck et al. IEEE Journal of Selected Topics in Quantum Electronics, vol. 17(2), 2011.
3. D. Liang et al. Applied Physics A 103(1), 2011.
4. A. W. Fang et al. Optics Express, vol. 16(7), 2008.