Engineering Gaussian disorder at rough interfaces for light trapping in thin-film solar cells

Optics Letters

Volumn 37, Issue 23, 2012, Pages 4868-4870

  Kowalczewski, Piotr ^a   Liscidini, Marco ^a   Andreani, Lucio Claudio ^a  

^a UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION ENHANCEMENT; DISORDER PARAMETERS; FIGURE OF MERITS; GAUSSIAN DISORDER; LATERAL CORRELATION LENGTH; LIGHT-TRAPPING; ROOT MEAN SQUARE; ROUGH INTERFACES; ROUGH SUBSTRATES; STATISTICAL PARAMETERS; THEORETICAL STUDY; THIN-FILM SILICON SOLAR CELLS; THIN-FILM SOLAR CELLS;

OPTICS; OPTOELECTRONIC DEVICES;

OPTIMIZATION;

EID: 84870438727     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.004868     Document Type: Article

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