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Volumn 103, Issue , 2013, Pages 253-260

Model immunoassay on silicon surfaces: Vertical and lateral nanostructure vs. protein coverage

Author keywords

Amino organosilane films; Angle resolved X ray photoelectron spectroscopy; Atomic force microscopy; Immunoglobulins; Specific binding; Time of flight secondary ion mass spectrometry

Indexed keywords

AFM; AFM IMAGE; ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY; ANTIBODY CONCENTRATION; AVERAGE HEIGHT; BOVINE SERUM ALBUMINS; FREE SURFACES; HEIGHT DISTRIBUTION; IMMUNOGLOBULINS; MEAN SIZE; MOUSE IGG; PROTEIN LAYERS; PROTEIN STRUCTURES; SIGNAL RATIOS; SILICON SURFACES; SPECIFIC BINDING; SURFACE COVERAGES; SURFACE FEATURE; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF-SIMS ANALYSIS; TRIETHOXYSILANE;

EID: 84870201092     PISSN: 09277765     EISSN: 18734367     Source Type: Journal    
DOI: 10.1016/j.colsurfb.2012.10.047     Document Type: Article
Times cited : (21)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.