Microstructure and dielectric properties of glass/Al2O 3 composites with various low softening point borosilicate glasses

Journal of Materials Science: Materials in Electronics

Volumn 23, Issue 12, 2012, Pages 2130-2139

  Liu, Ming ^a   Zhou, Hongqing ^a   Zhu, Haikui ^a   Yue, Zhenxing ^b   Zhao, Jianxin ^a  

^a NANJING TECH UNIVERSITY   (China)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITION OF AL; ALKALI OXIDE; BULK DENSITY; FTIR; GLASS NETWORK; SINTERING BEHAVIORS; SOFTENING POINTS; SOFTENING TEMPERATURE; XRD;

BOROSILICATE GLASS; LEAD OXIDE; SINTERING; SODIUM;

DIELECTRIC PROPERTIES OF SOLIDS;

EID: 84869508634     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-012-0719-4     Document Type: Article

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