Metrology and process optimization for large area monolithically integrated Cu(In,Ga)Se2 modules

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 1974-1977

  Lu, Dingyuan ^a   Christiansen, Eric P ^a   Walsh, Colm W ^a   Chase, Joseph F ^a   Miller, Roy M ^a   Miller, Michael F ^a   Martinez, Casiano R ^a   Sang, Baosheng ^a   Stanbery, B J ^a  

^a HelioVolt Corporation   (United States)

Author keywords

CIGS; electroluminescence; metrology; monolithic integrated circuits; photovoltaic cells; thin film devices

Indexed keywords

ARGON GAS; CDS BUFFER; CIGS; CIRCUIT STRUCTURES; CU(IN , GA)SE; DEVICE PERFORMANCE; FILM DENSITY; HIGHER EFFICIENCY; HOMOGENEOUS NUCLEATION; IN-PROCESS; LARGE AREA MODULE; MODULE EFFICIENCY; MONOLITHICALLY INTEGRATED; NICHE MARKETS; NON-UNIFORMITIES; PARTICLE GENERATION; PHOTOVOLTAIC; ROOT CAUSE; SMALL AREA; SOLAR MODULE; SPECULAR REFLECTANCE; SPUTTER PRESSURE; TRANSPORT SPEED;

ARGON; CADMIUM COMPOUNDS; CADMIUM SULFIDE; EFFICIENCY; GALLIUM; MANUFACTURE; MEASUREMENTS; MOLYBDENUM; MONOLITHIC INTEGRATED CIRCUITS; OPTIMIZATION; PHOTOVOLTAIC CELLS; PROCESS CONTROL; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILM DEVICES; THIN FILMS; UNITS OF MEASUREMENT;

ELECTROLUMINESCENCE;

EID: 84869464351     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317983     Document Type: Conference Paper

References (5)

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