Simple method to characterize nonlinear refraction and loss in optical waveguides

Optics Letters

Volumn 37, Issue 22, 2012, Pages 4693-4695

  Wathen, Jeremiah J ^a,b   Pagán, Vincent R ^a,c   Murphy, Thomas E ^a,c,d  

^a LABORATORY FOR PHYSICAL SCIENCES   (United States)

^b University of Maryland   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

^d University of Maryland   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM GALLIUM ARSENIDE; OPTICAL WAVEGUIDES; WAVEGUIDES;

ALGAAS WAVEGUIDES; ALLOY CONCENTRATION; COUPLING EFFICIENCY; NON-LINEAR REFRACTION; OPTICAL PROPAGATION LOSS; SILICON WAVEGUIDE; SIMPLE METHOD; THIRD-ORDER NON-LINEARITY;

NONLINEAR OPTICS;

EID: 84869166845     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.004693     Document Type: Article

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