Synthesis and characterization of layered vanadium oxide nanotubes for rechargeable lithium batteries

ECS Transactions

Volumn 35, Issue 34, 2011, Pages 237-245

  McNulty, D ^a   Buckley, D N ^a   O'Dwyer, C ^a  

^a UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONALIZED; HOLLOW CORES; HYDROTHERMAL TREATMENTS; INTERLAYER DISTANCE; INTERLAYER SPACINGS; LOW-YIELD; MOLAR RATIO; MOLECULAR LENGTH; PHYSICAL LENGTH; PRIMARY AMINES; RECHARGEABLE LITHIUM BATTERY; SURFACE BOUNDS; VANADIUM OXIDE LAYERS; VANADIUM OXIDE NANOTUBES; VANADIUM OXIDES;

AMINES; ENERGY STORAGE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; OXIDES; VANADIUM COMPOUNDS; X RAY DIFFRACTION; XEROGELS;

NANOTUBES;

EID: 84869072687     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3654222     Document Type: Conference Paper

References (17)

1. M. S. Whittingham, Chem. Rev., 104, 4271 (2004).
2. J. M. Tarascon and M. Armand, Nature, 414, 359 (2001).
3. S. Wang, Z. Lu, D. Wang, C. Li, C. Chen and Y. Yin, J. Mater. Chem., 21, 6365 (2011).
4. M. Roppolo, C. B. Jacobs, S. Upreti, N. A. Chernova and M. S.Whittingham, J. Mater. Sci.,43, 4742 (2008).
5. Y. Wang, K. Takahashi, K. Lee and G.Z. Cao, Adv.Funct.Mater.,19, 1497 (2009).
6. D. W. Murphy, P. A. Christian, F. J. Disalvo and J. V. Waszczak, Inorg. Chem., 18, 2800 (1979).
7. M. E.Spahr, P. Stoschitzki-Bitterli, R. Nesper, O. Haas, and P.Novák, J. Electrochem. Soc., 146,2780 (1999).
8. F. Sediri, F. Touati and N. Gharbi, Mater.Lett.,61, 1946 (2007).
9. A. Liu, M. Ichihara, I.Honma and H. Zhou,Electrochem.Commun.,9, 1766 (2007).
10. G. R. Patzke, F. Krumeich and R. Nesper, Angew. Chem. Int. Ed.,41, 2446 (2002).
11. H. J.Muhr, F. Krumeich, U. P. Schönholzer, F. Bieri, M.Niederberger, L. J. Gauckler, and R.Nesper, Adv. Mater., 12, 231 (2000).
12. H. G. Bachmann, F. R. Ahmed and Z. Barnes,Z. Kristallogr, 115, 110 (1961).
13. F. Krumeich, H.J. Muhr, M. Niederberger, F. Bieri, B. Schnyder and R. Nesper, J. Am. Chem. Soc., 121, 8324 (1999).
14. V. Petkov, P. Y. Zavalij, S. Lutta, M. S. Whittingham, V. Parvanov and S. Shastri, Phys. Rev. B., 69, 85410 (2004)
15. M. Giorgetti, S. Passerini, W. H. Smyrl and M. Berrettoni, Inorg. Chem., 39, 1514 (2000)
16. D. Thompson and B. K. Hodnett, Top. Catal., 50, 116 (2008)
17. Note: In some cases, the diffractometer was not capable of acquiring diffraction data below 4°.