Molecular dynamics simulation and electrical conductivity measurement of Na 2O•3SiO 2 melt under high pressure; Relationship between its structure and properties

Journal of Non-Crystalline Solids

Volumn 358, Issue 23, 2012, Pages 3109-3118

  Noritake, Fumiya ^a   Kawamura, Katsuyuki ^a   Yoshino, Takashi ^a   Takahashi, Eiichi ^b  

^a OKAYAMA UNIVERSITY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Electrical conductivity; Molecular dynamics; Pressure dependence; Silicate melt

Indexed keywords

ELECTRICAL CONDUCTIVITY; ELECTRICAL CONDUCTIVITY MEASUREMENTS; ENERGY SURFACE; FUNCTION OF PRESSURE; HIGH PRESSURE; INTERATOMIC POTENTIAL; MD SIMULATION; MOLECULAR DYNAMICS SIMULATIONS; NEGATIVE PRESSURES; PRESSURE DEPENDENCE; QUANTUM CHEMICAL CALCULATIONS; SELF-DIFFUSION COEFFICIENTS; SILICATE MELTS; SODIUM ATOM; STRUCTURE AND PROPERTIES;

ATOMS; DIFFUSION; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; MOLECULAR DYNAMICS; QUANTUM CHEMISTRY; SILICON; SODIUM;

O RINGS;

EID: 84869068751     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2012.08.027     Document Type: Article

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