Non-classical conductor losses due to copper foil roughness and treatment

IPC - Electronic Circuits World Convention, Printed Circuits Expo, Apex, and the Designers Summit 2005, ECWC 10: The Perfect Fit

Volumn 2, Issue , 2005, Pages 898-908

  Brist, Gary ^a   Hall, Stephen ^a   Clouser, Sidney ^b   Liang, Tao ^a  

^a INTEL CORPORATION   (United States)

^b Gould Electronics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTOR LOSS; COPPER FOILS; COPPER LOSS; COPPER ROUGHNESS; DIGITAL INTERCONNECTS; FREQUENCY DEPENDENT; HIGH FREQUENCY LOSS; HIGH-FREQUENCY MODELING; SIGNAL ATTENUATION; SQUARE ROOTS;

CHARACTERIZATION; COPPER; DIELECTRIC DEVICES; DIELECTRIC MATERIALS; EXHIBITIONS; POLYCHLORINATED BIPHENYLS; PRINTED CIRCUITS; SIGNAL PROCESSING;

DIELECTRIC LOSSES;

EID: 84869053850     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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