XANES and XEOL investigation of cerium and terbium co-doped silicon oxide films

ECS Transactions

Volumn 45, Issue 5, 2012, Pages 43-48

  Wilson, P R J ^a   Khatami, Z ^a   Dabkowski, R ^a   Dunn, K ^a   Chelomentsev, E ^a   Wojcik, J ^a   Mascher, P ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY TRANSFER; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LUMINESCENCE; NANOCRYSTALLITES; NANOSTRUCTURED MATERIALS; OXIDE FILMS; PHOTOLUMINESCENCE SPECTROSCOPY; SILICA; SILICATES; SILICON OXIDES; TERBIUM COMPOUNDS; THIN FILMS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

AFTER HIGH TEMPERATURE; DIRECT ENERGY TRANSFERS; EMISSION INTENSITY; GREEN LUMINESCENCE; SILICATE PHASE; STRONG ENHANCEMENT; X RAY ABSORPTION NEAR EDGE STRUCTURE; X-RAY EXCITED OPTICAL LUMINESCENCE;

CERIUM COMPOUNDS;

EID: 84869051779     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3700408     Document Type: Conference Paper

References (5)

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