Detecting signals buried in noise via nanowire transistors using stochastic resonance

Applied Physics Letters

Volumn 101, Issue 19, 2012, Pages

  Nishiguchi, Katsuhiko ^a   Fujiwara, Akira ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT CHARACTERISTIC; DYNAMIC BISTABILITY; NANOWIRE TRANSISTORS; STOCHASTIC RESONANCES; STRONG NONLINEARITY; THERMAL LIMITATIONS; WEAK SIGNALS;

CIRCUIT RESONANCE; FIELD EFFECT TRANSISTORS; MAGNETIC RESONANCE; NANOWIRES;

SIGNAL DETECTION;

EID: 84869027336     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4766946     Document Type: Article

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