Multiple scale pattern recognition and the foundation of observation-free statistics

American Society for Photogrammetry and Remote Sensing - Annual Conference 2005 - Geospatial Goes Global: From Your Neighborhood to the Whole Planet

Volumn 2, Issue , 2005, Pages 859-869

  Pontius, Robert Gilmore ^a   Chen, Hao ^a   Thontteh, Olufunmilayo ^a  

^a CLARK UNIVERSITY   (United States)

Author keywords

MAE; Pattern; Resolution; RMSE; Scale

Indexed keywords

MAE; MEAN ABSOLUTE ERROR; MULTIPLE RESOLUTIONS; MULTIPLE SCALE; PATTERN; RMSE; ROOT MEAN SQUARE ERRORS; SCALE; SPATIAL ARRANGEMENTS; STATISTICAL MEASURES; VEGETATION CHANGE; VISUAL ASSESSMENTS;

OPTICAL RESOLVING POWER; PATTERN RECOGNITION; REMOTE SENSING; SENSITIVITY ANALYSIS;

MEAN SQUARE ERROR;

EID: 84869024857     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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