SMATT: Smart meter ATTestation using multiple target selection and copy-proof memory

Lecture Notes in Electrical Engineering

Volumn 203 LNEE, Issue , 2012, Pages 875-887

  Park, Haemin ^a   Seo, Dongwon ^a   Lee, Heejo ^a   Perrig, Adrian ^b  

^a Korea University   (South Korea)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL OVERHEADS; ELECTRICAL GRIDS; EXPERIMENTAL ENVIRONMENT; LARGE-SCALE NETWORK; MALWARE DETECTION; MALWARES; MEMORY MECHANISM; MULTIPLE TARGETS; SECURITY AND PRIVACY; SI EPIDEMIC MODELS; SMART GRID; SMART METERS; SOFTWARE-BASED;

COMPUTER CRIME; COMPUTER SCIENCE;

SMART POWER GRIDS;

EID: 84868557944     PISSN: 18761100     EISSN: 18761119     Source Type: Book Series    
DOI: 10.1007/978-94-007-5699-1_90     Document Type: Conference Paper

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