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Volumn 83, Issue 10, 2012, Pages
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Simultaneous imaging electron- and ion-feature Thomson scattering measurements of radiatively heated Xe
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Author keywords
[No Author keywords available]
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Indexed keywords
A-SPOTS;
CHARGE STATE;
FEATURE ANALYSIS;
FEATURE MEASUREMENT;
ION SCATTERING;
NEUTRAL PRESSURES;
PROBE BEAM;
SIMULTANEOUS IMAGING;
SPATIAL RESOLUTION;
SPOT SIZES;
TARGET CHAMBERS;
TEMPERATURE PROFILES;
TEMPORAL RESOLUTION;
THOMSON SCATTERING;
XE PLASMAS;
ELECTRONS;
IONS;
LEAD;
LIGHT SCATTERING;
PLASMAS;
PROBES;
ELECTRON TEMPERATURE;
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EID: 84868383583
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.4740526 Document Type: Conference Paper |
Times cited : (4)
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References (7)
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