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Volumn 83, Issue 10, 2012, Pages

Simultaneous imaging electron- and ion-feature Thomson scattering measurements of radiatively heated Xe

Author keywords

[No Author keywords available]

Indexed keywords

A-SPOTS; CHARGE STATE; FEATURE ANALYSIS; FEATURE MEASUREMENT; ION SCATTERING; NEUTRAL PRESSURES; PROBE BEAM; SIMULTANEOUS IMAGING; SPATIAL RESOLUTION; SPOT SIZES; TARGET CHAMBERS; TEMPERATURE PROFILES; TEMPORAL RESOLUTION; THOMSON SCATTERING; XE PLASMAS;

EID: 84868383583     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4740526     Document Type: Conference Paper
Times cited : (4)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.