X-ray spectroscopic study of Cu 2S, CuS, and copper films exposed to Na 2S solutions

Journal of Physical Chemistry C

Volumn 116, Issue 42, 2012, Pages 22293-22300

  Vegelius, J R ^a   Kvashnina, K O ^b   Hollmark, H ^a   Klintenberg, M ^a   Kvashnin, Y O ^b   Soroka, I L ^c   Werme, L ^a   Butorin, S M ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER FILMS; COPPER SULFIDES; CU FILMS; CU FOIL; CU IONS; CU K-EDGE; EMISSION SPECTRUMS; FLUORESCENCE DETECTION; IN-SITU; INTERACTION PROCESS; SPECTRAL WIDTHS; SPECTROSCOPIC STUDIES; SULFIDE SPECIES; X RAY EMISSION SPECTROSCOPY;

ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; HEAVY IONS; METAL CLADDING; METALLIC FILMS; SPECTROSCOPIC ANALYSIS; SULFUR COMPOUNDS; THICK FILMS; X RAY ABSORPTION SPECTROSCOPY;

SODIUM;

EID: 84867862590     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp302390c     Document Type: Article

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