Computational microstructure characterization and reconstruction for stochastic multiscale material design

CAD Computer Aided Design

Volumn 45, Issue 1, 2013, Pages 65-76

  Liu, Yu ^a   Steven Greene, M ^b   Chen, Wei ^b   Dikin, Dmitriy A ^b   Liu, Wing Kam ^b  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b Northwestern University   (United States)

Author keywords

Material parameterization; Microstructure characterization; Microstructure reconstruction; Multiscale material design

Indexed keywords

CRITICAL COMPONENT; GRAY-SCALE IMAGES; IN-LINE; KEY MATERIALS; MATERIAL DESIGNS; MATERIAL PROCESSING; MATERIAL PROPERTY; MATERIAL STRUCTURE; MICROSCOPIC IMAGE; MICROSTRUCTURE CHARACTERIZATION; MICROSTRUCTURE CORRELATION; MULTI-SCALE DESIGN; MULTISCALES; NUMERICAL ALGORITHMS; PHYSICALLY BASED; REGRESSION MODEL; REGRESSION PARAMETERS; SIMULATED ANNEALING ALGORITHMS; STRUCTURAL DOMAINS; TWO-COMPONENT; TWO-MATERIALS; TWO-PHASE MATERIALS;

ALGORITHMS; CHARACTERIZATION; MICROSTRUCTURE; REGRESSION ANALYSIS; STOCHASTIC SYSTEMS; STRUCTURAL DESIGN;

MATERIALS;

EID: 84867669066     PISSN: 00104485     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cad.2012.03.007     Document Type: Article

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