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Volumn 332, Issue 2, 2013, Pages 282-293

A two-step approach for crack identification in beam

Author keywords

[No Author keywords available]

Indexed keywords

BEAM STRUCTURES; CRACK DEPTHS; CRACK IDENTIFICATION; CRACK LOCATION; CRACK PARAMETERS; MEASUREMENT NOISE; MODE SHAPE CURVATURES; MODEL UPDATING; MULTIPLE CRACK; RESPONSE SENSITIVITY; RESPONSE SENSITIVITY ANALYSIS; SINGLE CRACK; TWO-STEP APPROACH;

EID: 84867662739     PISSN: 0022460X     EISSN: 10958568     Source Type: Journal    
DOI: 10.1016/j.jsv.2012.08.025     Document Type: Article
Times cited : (48)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.