Integrated compact optical vortex beam emitters

Science

Volumn 338, Issue 6105, 2012, Pages 363-366

  Cai, Xinlun ^a   Wang, Jianwei ^a   Strain, Michael J ^b   Johnson Morris, Benjamin ^a   Zhu, Jiangbo ^c,d   Sorel, Marc ^b   O'Brien, Jeremy L ^a   Thompson, Mark G ^a   Yu, Siyuan ^a,c  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c SUN YAT SEN UNIVERSITY   (China)

^d FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ANGULAR MOMENTUM; EXPERIMENTAL STUDY; INTEGRATED APPROACH; OXIDE; SEMICONDUCTOR INDUSTRY; SILICON; VORTEX;

ARTICLE; FIELD EMISSION; PHOTON; POLARIZATION; PRIORITY JOURNAL; REFRACTION INDEX; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR;

EID: 84867645041     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1226528     Document Type: Article

References (26)

1. L. Allen, M. W. Beijersbergen, R. J. C. Spreeuw, J. P. Woerdman, Phys. Rev. A 45, 8185 (1992).
2. S. Fürhapter, A. Jesacher, S. Bernet, M. Ritsch-Marte, Opt. Lett. 30, 1953 (2005).
3. D. G. Grier, Nature 424, 810 (2003).
4. G. Gibson et al., Opt. Express 12, 5448 (2004).
5. N. K. Fontaine, C. R. Doerr, L. Buhl, in Optical Fiber Communication Conference, OSA Technical Digest (Optical Society of America, Washington, DC, 2012), paper OTu1l.2.
6. A. Mair, A. Vaziri, G. Weihs, A. Zeilinger, Nature 412, 313 (2001).
7. G. Molina-Terriza, J. P. Torres, L. Torner, Nat. Phys. 3, 305 (2007).
8. N. R. Heckenberg, R. McDuff, C. P. Smith, A. G. White, Opt. Lett. 17, 221 (1992).
9. M. W. Beijersbergen, R. P. C. Coerwinkel, M. Kristensen, J. P. Woerdman, Opt. Commun. 112, 321 (1994).
10. L. Marrucci, C. Manzo, D. Paparo, Phys. Rev. Lett. 96, 163905 (2006).
11. G. Biener, A. Niv, V. Kleiner, E. Hasman, Opt. Lett. 27, 1875 (2002).
12. N. Yu et al., Science 334, 333 (2011).
13. M. Smit, J. van der Tol, M. Hill, Laser Photon. Rev. 6, 1 (2012).
14. C. R. Doerr, L. L. Buhl, Opt. Lett. 36, 1209 (2011).
15. K. J. Vahala, Nature 424, 839 (2003).
16. Materials and methods are available as supplementary materials on Science Online.
17. A. B. Matsko, A. A. Savchenkov, D. Strekalov, L. Maleki, Phys. Rev. Lett. 95, 143904 (2005).
18. D. Taillaert et al., Jpn. J. Appl. Phys. 45, 6071 (2006).
19. R. Dorn, S. Quabis, G. Leuchs, Phys. Rev. Lett. 91, 233901 (2003).
20. Z. Bomzon, V. Kleiner, E. Hasman, Opt. Lett. 26, 1424 (2001).
21. A. Niv, G. Biener, V. Kleiner, E. Hasman, Opt. Express 14, 4208 (2006).
22. I. Moreno, J. A. Davis, I. Ruiz, D. M. Cottrell, Opt. Express 18, 7173 (2010).
23. A. Yariv, Electron. Lett. 36, 321 (2000).
24. Y. Yu, R. O'Dowd, IEEE Photon. Technol. Lett. 14, 1397 (1992).
25. S. Manipatruni, Q. Xu, M. Lipson, Opt. Express 15, 13035 (2007).
26. K. Ladavac, D. Grier, Opt. Express 12, 1144 (2004).