Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability

Springer Series in Materials Science

Volumn 157, Issue 1, 2012, Pages

  He, Ming ^a   Lu, Toh Ming ^b  

^a Rensselaer Polytechnic Institute   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

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Indexed keywords

EID: 84867569549     PISSN: 0933033X     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-1-4614-1812-2_1     Document Type: Article

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