Imaging bacteriophage T4 interacting with a polyethyleneimine layer by atomic force microscopy: Evidences of substructures

Journal of Advanced Microscopy Research

Volumn 5, Issue 3, 2010, Pages 177-180

  Tiliket, Ghania ^a   Lebrun, Laurent ^a   Nguyen, Trong ^a   Valleton, Jean Marc ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

Atomic force microscopy; Bacteriophage T4; Polyethyleneimine

Indexed keywords

BACTERIOPHAGE T4; HIGHER RESOLUTION; MODEL SURFACE; POLYETHYLENEIMINE; POLYETHYLENIMINES; THIN LAYERS;

ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPY;

BACTERIOPHAGES;

EID: 84867532524     PISSN: 21567573     EISSN: 21567581     Source Type: Journal    
DOI: 10.1166/jamr.2010.1039     Document Type: Article

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