Terahertz detection using spectral domain interferometry

Optics Letters

Volumn 37, Issue 20, 2012, Pages 4338-4340

  Sharma, Gargi ^a   Singh, Kanwarpal ^a   Al Naib, Ibraheem ^a   Morandotti, Roberto ^a   Ozaki, Tsuneyuki ^a  

^a INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE DIFFERENCE; SPECTRAL DOMAIN INTERFEROMETRY; TERAHERTZ; TERAHERTZ DETECTION; THZ SOURCES;

ELECTRIC FIELDS; INTERFEROMETRY;

STRAIN MEASUREMENT;

EID: 84867479709     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.004338     Document Type: Article

References (14)

1. B. B. Hu and M. C. Nuss, Opt. Lett. 20, 1716 (1995).
2. S. Kono, M. Tani, P. Gu, and K. Sakai, Appl. Phys. Lett. 77, 4104 (2000).
3. X. Lu and X.-C. Zhang, Appl. Phys. Lett. 98, 151111 (2011).
4. Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 67, 3523 (1995).
5. Z. Jiang and X.-C. Zhang, Opt. Lett. 23, 1114 (1998).
6. S. P. Jamison, J. Shen, A. M. MacLeod, W. A. Gillespie, and D. A. Jaroszynski, Opt. Lett. 28, 1710 (2003).
7. K. Y. Kim, B. Yellampalle, A. J. Taylor, G. Rodriguez, and J. H. Glownia, Opt. Lett. 32, 1968 (2007).
8. Y. Kawada, T. Yasuda, H. Takahashi, and S.-I. Aoshima, Opt. Lett. 33, 180 (2008).
9. J. Fletcher, Opt. Express 10, 1425 (2002).
10. J. Zhang, B. Rao, L. Yu, and Z. Chen, Opt. Lett. 34, 3442 (2009).
11. A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. El-Zaiat, Opt. Commun. 117, 43 (1995).
12. K. Singh, C. Dion, S. Costantino, M. Wajszilber, M. R. Lesk, and T. Ozaki, Exp. Eye Res. 91, 63 (2010).
13. K. Singh, C. Dion, M. R. Lesk, T. Ozaki, and S. Costantino, Rev. Sci. Instrum. 82, 023706 (2011).
14. T. Bajraszewski, M. Wojtkowski, M. Szkulmowski, A. Szkulmowska, R. Huber, and A. Kowalczyk, Opt. Express 16, 4163 (2008).