Computational quantification and correction of the errors induced by layer removal for subsurface residual stress measurements

International Journal of Mechanical Sciences

Volumn 64, Issue 1, 2012, Pages 184-195

  Savaria, Vincent ^a   Bridier, Florent ^a   Bocher, Philippe ^a  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

Author keywords

FEA matrix relaxation correction method; Layer removal; Moore and Evans correction; Relaxation correction; Residual stress; X ray diffraction

Indexed keywords

CORRECTION METHOD; LAYER REMOVAL; MATRIX RELAXATION; STRESS FIELD;

ELECTROLYTIC POLISHING; ELECTROMAGNETIC WAVE ATTENUATION; STRESS MEASUREMENT; X RAY DIFFRACTION;

RESIDUAL STRESSES;

EID: 84867401814     PISSN: 00207403     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijmecsci.2012.07.003     Document Type: Article

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