A simple method for the detection of outliers

Electronic Journal of Applied Statistical Analysis

Volumn 2, Issue 1, 2009, Pages 67-76

  Ueda, Taichiro ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

AIC; Masking effect; Outliers; Stirling's formula

Indexed keywords

EID: 84867123778     PISSN: None     EISSN: 20705948     Source Type: Journal    
DOI: 10.1285/i20705948v2n1p67     Document Type: Article

References (9)

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