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Volumn 2, Issue , 2006, Pages 863-871

Backward compatibility study of lead free area array packages with tin-lead soldering process

Author keywords

Backward compatibility; Backward compatible assembly; Lead free; Mixed alloy; Reflow temperature; SAC; Tin percentage

Indexed keywords

BACKWARD COMPATIBILITY; BACKWARD COMPATIBLE; LEAD-FREE; REFLOW TEMPERATURES; SAC;

EID: 84867025077     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (5)
  • 2
    • 54249135910 scopus 로고    scopus 로고
    • Low-temperature, high-reliability assembly of lead-free CSPs
    • Germany
    • T. Gregorich, P.Holmes, "Low-Temperature, High-Reliability Assembly of Lead-Free CSPs", IPC Lead-Free Conference, Germany, 2003.
    • (2003) IPC Lead-Free Conference
    • Gregorich, T.1    Holmes, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.