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Volumn 2, Issue , 2006, Pages 863-871
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Backward compatibility study of lead free area array packages with tin-lead soldering process
a a a a |
Author keywords
Backward compatibility; Backward compatible assembly; Lead free; Mixed alloy; Reflow temperature; SAC; Tin percentage
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Indexed keywords
BACKWARD COMPATIBILITY;
BACKWARD COMPATIBLE;
LEAD-FREE;
REFLOW TEMPERATURES;
SAC;
ALLOYS;
CUTTING TOOLS;
EXHIBITIONS;
LEAD;
METALLURGY;
OPTIMIZATION;
PRINTED CIRCUITS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SOLDERING;
TIN ALLOYS;
TIN;
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EID: 84867025077
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (9)
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References (5)
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