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Volumn 2, Issue , 2007, Pages 823-833
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Verifying microvoid elimination and prevention via an optimized immersion silver process
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CIRCUIT BOARDS;
ELECTRONIC GOODS;
END-USES;
IMMERSION SILVER;
MICRO VOIDS;
MICROVOID;
MICROVOIDING;
MULTIPLE REFLOW CYCLES;
OPTIMIZED PROCESS;
PB-FREE;
PROCESS SIMPLICITY;
ROOT CAUSE;
VERIFICATION DATA;
ELECTRONICS INDUSTRY;
EXHIBITIONS;
LEAD;
OPTIMIZATION;
PRINTED CIRCUITS;
SOLDERING ALLOYS;
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EID: 84866937236
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (10)
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