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Volumn 2, Issue , 2007, Pages 823-833

Verifying microvoid elimination and prevention via an optimized immersion silver process

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT BOARDS; ELECTRONIC GOODS; END-USES; IMMERSION SILVER; MICRO VOIDS; MICROVOID; MICROVOIDING; MULTIPLE REFLOW CYCLES; OPTIMIZED PROCESS; PB-FREE; PROCESS SIMPLICITY; ROOT CAUSE; VERIFICATION DATA;

EID: 84866937236     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (10)
  • 2
    • 84866929779 scopus 로고    scopus 로고
    • Characterization, reproduction, and resolution of solder joint microvoiding
    • Anaheim, February
    • Cullen, D, "Characterization, Reproduction, and Resolution of Solder Joint Microvoiding", APEX 2005, Anaheim, February 2005
    • (2005) APEX 2005
    • Cullen, D.1
  • 3
    • 79951621425 scopus 로고    scopus 로고
    • Optimal reflow profile fir lead-free server board and failure analysis of solder joint after temperature cyclic test
    • Taipei
    • Yu et al, "Optimal Reflow Profile fir Lead-free Server Board and Failure Analysis of Solder Joint after Temperature Cyclic Test", TPCA Forum, Taipei 2005
    • (2005) TPCA Forum
    • Yu1
  • 4
    • 84866918645 scopus 로고    scopus 로고
    • Impact of PCB surface pad finish and contamination on BGA solder joint voiding
    • Eckel et al, "Impact of PCB Surface Pad Finish and Contamination on BGA Solder Joint Voiding", Pan Pacific Microelectronics Symposium, 2001
    • (2001) Pan Pacific Microelectronics Symposium
    • Eckel1
  • 5
    • 0742284473 scopus 로고    scopus 로고
    • The effect of variation in nickel/Gold surface finish on the assembly quality and attachment reliability of a plastic ball grid array
    • December
    • Coyle et al, "The Effect of Variation in Nickel/Gold Surface Finish on the Assembly Quality and Attachment Reliability of a Plastic Ball Grid Array", IEEE Transactions on Component and Packaging Technologies, December 2003.
    • (2003) IEEE Transactions on Component and Packaging Technologies
    • Coyle1
  • 6
    • 84866918642 scopus 로고    scopus 로고
    • Planar microvoiding in lead-free second-level interconnect solder joints
    • Chicago IL, September
    • R. Aspandiar et al, "Planar Microvoiding in Lead-free Second-Level Interconnect Solder Joints", SMTA International, Chicago IL, September 2006
    • (2006) SMTA International
    • Aspandiar, R.1
  • 8
    • 84867817627 scopus 로고    scopus 로고
    • Eliminating microvoid risk via an optimized surface finish process
    • Toronto, May
    • D. Cullen, W. Paw, J. Swanson, L. Toscano, "Eliminating Microvoid Risk via an Optimized Surface Finish Process", CMAP Conference, Toronto, May 2006
    • (2006) CMAP Conference
    • Cullen, D.1    Paw, W.2    Swanson, J.3    Toscano, L.4
  • 10
    • 84866899893 scopus 로고    scopus 로고
    • A study of planar microvoiding in pb-free solder joints
    • Taipei, October
    • Y. Yau et al, "A Study of Planar Microvoiding in Pb-free Solder Joints", TPCA Forum, Taipei, October 2006
    • (2006) TPCA Forum
    • Yau, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.