Application of gauge RR to the rigorous measurement of quantum yield in fluorescent organic solid state systems

Review of Scientific Instruments

Volumn 83, Issue 7, 2012, Pages

  Green, A P ^a   Buckley, A R ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT LIMITS; LASER INTENSITIES; MEASUREMENT SYSTEM; ORGANIC SOLIDS; PERYLENES; PHOTOLUMINESCENCE QUANTUM YIELDS; POLY(9 ,9-DIOCTYLFLUORENE); SAMPLE PREPARATION; SOLID-STATE ORGANIC; SYSTEMATIC BIAS; TI: SAPPHIRE LASER; TI:SAPPHIRE;

ERROR STATISTICS; ESTERS; GALLIUM NITRIDE; QUANTUM YIELD; SAPPHIRE;

POLYCYCLIC AROMATIC HYDROCARBONS;

EID: 84866866041     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4737631     Document Type: Review

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