Investigation of nanocrystalline CdS/Si diode using complex impedance spectroscopy

Materials Research Bulletin

Volumn 47, Issue 11, 2012, Pages 3397-3402

  El Gendy, Y A ^a,b   Yahia, I S ^c,d   Yakuphanoglu, F ^e  

^a Helwan University   (Egypt)

^b UMM AL QURA UNIVERSITY   (Saudi Arabia)

^c Ain Shams University   (Egypt)

^d KING KHALID UNIVERSITY   (Saudi Arabia)

^e FIRAT UNIVERSITY   (Turkey)

Author keywords

A. Nanostructures; B. Vapor deposition; C. Atomic force microscopy; D. Electrical properties

Indexed keywords

AC CONDUCTIVITY; ATOMIC FORCE MICROSCOPE (AFM); BULK RESISTANCE; CDS; CDS THIN FILMS; COMPLEX IMPEDANCE; COMPLEX IMPEDANCE SPECTROSCOPY; CRYSTAL SIZE; DEPOSITED FILMS; DIFFERENT FREQUENCY; FUNCTION OF FREQUENCY; NANOCRYSTALLINES; POWER LAW RELATION; REAL PART; TEMPERATURE DEPENDENCE;

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; CADMIUM SULFIDE; DEPOSITS; SILICON;

ELECTRIC PROPERTIES;

EID: 84866740974     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2012.07.017     Document Type: Article

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