Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: Experiments and simulations

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

Volumn , Issue , 2011, Pages 124-127

  Riccio, M ^a   Irace, A ^a   Breglio, G ^a   Spirito, P ^a   Napoli, E ^a   Mizuno, Y ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b TOYOTA MOTOR CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE BEHAVIOR; CURRENT DISTRIBUTION; ELECTRO-THERMAL SIMULATION; ELEMENTARY CELLS; UNCLAMPED INDUCTIVE SWITCHING;

THERMODYNAMIC STABILITY;

EID: 84866736176     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.2011.5890806     Document Type: Conference Paper

References (8)

1. Y. Mizuno, R. Tagami, and K. Nishiwaki, "Investigations of inhomogeneous operation of IGBTs under Unclamped Inductive Switching Condition," in Proc. International Symposium on Power Semiconductor Devices & ICs (ISPSD), 2010, pp. 137-140.
2. C.-C. Shen et al., "Failure Dynamics of the IGBT During Turn-off for Unclamped Inductive Loading Conditions," IEEE Transactions on Industry Applications, vol. 36, pp. 614-624, 2000.
3. M. Riccio et al., "An equivalent-time temperature mapping system with a 320 256 pixels full-frame 100 khz sampling rate," Review of Scientific Instruments, vol. 78, pp. 106 106-3 pages, 2007.
4. A. Irace, G. Breglio, and P. Spirito, "New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs," Microelectronics Reliability, vol. 47, pp. 1696-1700, 2007.
5. A. R. Hefner, "Analytical modeling of device-circuit interactions for the power Insulated Gate Bipolar Transistor (IGBT)," IEEE Transaction on Industry Applications, vol. 26, pp. 995-1005, 1990.
6. "A dynamic electro-thermal model for the IGBT," IEEE Transactions on Industry Applications, vol. 30, pp. 394-405, 1994.
7. M. Riccio, M. Carli, L. Rossi, A. Irace, G. Breglio, and P. Spirito, "Compact electro-thermal modeling and simulation of large area multicellular Trench-IGBT," in 27th International Conference on Microelectronics, 2010, pp. 379-382.
8. P. Spirito, "An Analytical Expression for the Multiplication Factor M in Semiconductors with Equal Ionization Coefficients," IEEE Transactions on Electron Devices, vol. 8, pp. 951-953, 1972.