Effect of lactic acid on nucleation morphology and surface roughness of electroless Ni-P deposition in nanoscale

Bulletin of Materials Science

Volumn 35, Issue 4, 2012, Pages 561-566

  Babanejhad, A ^a   Hashemi, M ^a   Rahmatallahpur, Y ^a   Nozad, Sh A ^a  

^a Material Research School   (Iran)

Author keywords

AFM; Complexing agent; Electroless; Morphology; Nanoscale; SEM; Surface roughness

Indexed keywords

ACID CONCENTRATIONS; AFM; COMPLEXING AGENTS; DEPOSITION PROCESS; ELECTROLESS; ELECTROLESS NI-P; NANO SCALE; NO CONCENTRATION;

ATOMIC FORCE MICROSCOPY; DEPOSITION; LACTIC ACID; MORPHOLOGY; NANOTECHNOLOGY; NUCLEATION; SCANNING ELECTRON MICROSCOPY;

SURFACE ROUGHNESS;

EID: 84866436588     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12034-012-0341-3     Document Type: Article

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