Characterization of 1T-TiSe 2 surface by means of STM and XPD experiments and model calculations

Surface Science

Volumn 606, Issue 23-24, 2012, Pages 1760-1770

  Kuznetsov, M V ^a,b   Ogorodnikov, I I ^a,b   Vorokh, A S ^a,b   Rasinkin, A S ^a   Titov, A N ^b  

^a INSTITUTE OF SOLID STATE CHEMISTRY   (Russian Federation)

^b URAL FEDERAL UNIVERSITY   (Russian Federation)

Author keywords

Photoelectron holography; Scanning tunneling microscopy; Surface relaxation; Surface structure; Titanium diselenide; X ray photoelectron diffraction

Indexed keywords

3D RECONSTRUCTION; BASAL PLANES; MODEL CALCULATIONS; PATTERN SIMULATION; POLYTYPES; SCATTERING PATTERN; STRUCTURAL DEFECT; STRUCTURAL DISTORTIONS; SURFACE GEOMETRIES; SURFACE LAYERS; THEORETICAL CALCULATIONS; TITANIUM DISELENIDE; VAN DER WAALS; X RAY PHOTO-ELECTRON DIFFRACTION;

DIFFRACTION; HOLOGRAPHY; MAXIMUM ENTROPY METHODS; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; SCANNING TUNNELING MICROSCOPY; SELENIUM COMPOUNDS; SURFACE RELAXATION; SURFACE STRUCTURE; THREE DIMENSIONAL COMPUTER GRAPHICS; TITANIUM; VAN DER WAALS FORCES;

THREE DIMENSIONAL;

EID: 84866387119     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2012.06.008     Document Type: Article

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