Pressure dependency of thermal boundary conductance of carbon nanotube/silicon interface: A molecular dynamics study

Journal of Applied Physics

Volumn 112, Issue 5, 2012, Pages

  Liu, Huake ^a   Zeng, Huizhong ^a   Pan, Taisong ^a   Huang, Wen ^a   Lin, Yuan ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL SILICON; EXTERNAL PRESSURES; INTERFACIAL REGION; MOLECULAR DYNAMICS SIMULATIONS; PHONON DENSITY; PRESSURE DEPENDENCIES; SILICON SURFACES; THERMAL BOUNDARY CONDUCTANCE; THERMAL RELAXATION; VAN DER WAALS INTERACTIONS;

MOLECULAR DYNAMICS; SILICON; VAN DER WAALS FORCES;

THERMAL CONDUCTIVITY;

EID: 84866375901     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4749798     Document Type: Conference Paper

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