A photoelectron spectroscopy study of the electronic structure evolution in CuInSe 2-related compounds at changing copper content

Applied Physics Letters

Volumn 101, Issue 11, 2012, Pages

  Kuznetsova, T V ^a   Grebennikov, V I ^a   Zhao, H ^b   Derks, C ^c   Taubitz, C ^c   Neumann, M ^c   Persson, C ^b,d   Kuznetsov, M V ^e,f   Bodnar, I V ^g   Martin, R W ^h   Yakushev, M V ^h  

^a INSTITUTE OF METAL PHYSICS   (Russian Federation)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^c UNIVERSITY OF OSNABRÜCK   (Germany)

^d UNIVERSITY OF OSLO   (Norway)

^e INSTITUTE OF SOLID STATE CHEMISTRY   (Russian Federation)

^f URAL FEDERAL UNIVERSITY   (Russian Federation)

^g BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

^h UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER CONTENT; DENSITY-OF-STATES; RELATED COMPOUNDS; XPS SPECTRA;

COPPER; ELECTRONIC STRUCTURE; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER COMPOUNDS;

EID: 84866327111     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4752723     Document Type: Article

References (14)

1. P. Jackson, D. Hariskos, E. Lotter, S. Paetel, R. Wuerz, R. Menner, W. Wischmann, and M. Powalla, Prog. Photovoltaics 19, 894 (2011). 10.1002/pip.1078
2. J. E. Jaffe and A. Zunger, Phys. Rev. B 28, 5822 (1983). 10.1103/PhysRevB.28.5822
3. S. B. Zhang, S.-H. Wei, A. Zunger, and H. Katayama-Yosida, Phys. Rev. B 57, 9642 (1998). 10.1103/PhysRevB.57.9642
4. D. Schmid, M. Ruckh, F. Grunwald, and H. W. Schock, J. Appl. Phys. 73, 2902 (1993). 10.1063/1.353020
5. S.-H. Han, C. Persson, F. S. Hasoon, H. A. Al-Thani, A. M. Hermann, and D. H. Levi, Phys. Rev. B 74, 085212 (2006). 10.1103/PhysRevB.74.085212
6. D. Schmid, M. Ruckh, and H. W. Schock, Appl. Surf. Sci. 103, 409 (1996). 10.1016/S0169-4332(96)00099-2
7. I. V. Bodnar, I. T. Bodnar, V. F. Gremenok, A. M. Kovalchuk, and M. Leon, J. Cryst. Growth 293, 324 (2006). 10.1016/j.jcrysgro.2006.05.054
8. I. V. Bodnar', A. A. Vapolin, V. Yu. Rud ', and Yu. V. Rud ', Tech. Phys. Lett. 32, 1003 (2006). 10.1134/S1063785006120029
9. A. F. Carley and R. W. Joyner, J. Electron Spectrosc. Relat. Phenom. 16, 1 (1979). 10.1016/0368-2048(79)85001-X
10. P. E. Blöchl, Phys. Rev. B 50, 17953 (1994). 10.1103/PhysRevB.50. 17953
11. G. Kresse and J. Furthmüller, Phys. Rev. B 54, 11169 (1996). 10.1103/PhysRevB.54.11169
12. J. Heyd, G. E. Scuseria, and M. Ernzerhof, J. Chem. Phys. 124, 129906 (2006). 10.1063/1.2204597
13. J. C. Rife, R. N. Dexter, P. M. Bridenboum, and B. W. Veal, Phys. Rev. B 16, 4491 (1977). 10.1103/PhysRevB.16.4491
14. T. Schulmeyer, R. Hunger, A. Klein, and W. Jaegermann, Appl. Phys. Lett. 84, 3067 (2004). 10.1063/1.1712034