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Volumn 32, Issue 4, 2012, Pages 310-317

A pressure mapping imaging device based on electrical impedance tomography of conductive fabrics

Author keywords

Conductive fabrics; Deformation; Deformation sensor; Electrical impedance tomography; Pressure; Pressure mapping imaging; Sensors

Indexed keywords

APPLICATION AREA; CONDUCTIVE FABRICS; CONDUCTIVE KNITTED FABRIC; DEFORMATION MAPPING; DESIGN/METHODOLOGY/APPROACH; ELECTRICAL CONDUCTIVITY; ELECTRICAL IMPEDANCE; ELECTRICAL IMPEDANCE MEASUREMENT; ELECTRICAL IMPEDANCE TOMOGRAPHY; IMAGING DEVICE; IMAGING SENSORS; KNITTED STRUCTURES; LOW-COST SOLUTION; MAPPING TECHNIQUES; PRESSURE MAPPING; PROOF OF PRINCIPLES; TOUCH SENSING; WEARABLE COMPUTING;

EID: 84866271919     PISSN: 02602288     EISSN: None     Source Type: Journal    
DOI: 10.1108/02602281211257542     Document Type: Review
Times cited : (42)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.