A collisional model for AFM manipulation of rigid nanoparticles

Beilstein Journal of Nanotechnology

Volumn 1, Issue 1, 2010, Pages 158-162

  Gnecco, Enrico ^a,b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b INSTITUTO MADRILEÑO DE ESTUDIOS AVANZADOS EN NANOCIENCIA IMDEA NANOCIENCIA   (Spain)

Author keywords

Atomic force microscopy; Nanomanipulation; Nanoparticles

Indexed keywords

AFM MANIPULATION; DIRECTION OF MOTION; FAST SCAN; NANOMANIPULATIONS; SCAN LINE; SCAN PATH;

ATOMIC FORCE MICROSCOPY; MICROMANIPULATORS; NANOTECHNOLOGY; NANOWIRES;

NANOPARTICLES;

EID: 84866171576     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.1.19     Document Type: Article

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