Structural, optical, and transport properties of α- And β-Ag 3VO 4

Chemistry of Materials

Volumn 24, Issue 17, 2012, Pages 3346-3354

  Cloet, V ^a   Raw, A ^a   Poeppelmeier, K R ^a   Trimarchi, G ^a   Peng, H ^a   Im, J ^a   Freeman, A J ^a   Perry, N H ^b   Mason, T O ^b   Zakutayev, A ^c   Ndione, P F ^c   Ginley, D S ^c   Perkins, J D ^c  

^a NORTHWESTERN UNIVERSITY   (United States)

^b Northwestern University   (United States)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Ag 3VO 4; Ag 3VO 4; electrical conductivity; single crystal; thin film

Indexed keywords

BULK PROPERTIES; COMBINATORIAL SPUTTERING; DIFFUSE REFLECTANCE SPECTROSCOPY; ELECTRICAL CONDUCTIVITY; IMPEDANCE SPECTROSCOPY; IN-SITU MEASUREMENT; OPTICAL AND ELECTRICAL PROPERTIES; PHASE-TRANSITION TEMPERATURE; POLYCRYSTALLINE; SINGLE CRYSTAL X-RAY DIFFRACTION; XRD;

ELECTRIC CONDUCTIVITY; PULSED LASER DEPOSITION; SINGLE CRYSTALS; THIN FILMS; TRANSPORT PROPERTIES; X RAY DIFFRACTION;

SILVER;

EID: 84866064302     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm301119c     Document Type: Article

References (41)

1. Hirono, T.; Yamada, T. J. Appl. Phys. 1984, 55, 781.
2. Jansen, M. Angew. Chem., Int. Ed. 1987, 26 (11), 1098-1110.
3. Linke, C.; Jansen, M. Inorg. Chem. 1994, 33, 2614-2616
4. Kohler, B.; Jansen, M.; Weppner, W. J. Solid State Chem. 1985, 57, 227-233
5. Kumar, S.; Gupta, H. C. Comput. Theor. Chem. 2011, 977, 78-85
6. Ouyang, S.; Kikugawa, N.; Chen, D.; Zou, Z.; Ye, J. J. Phys. Chem. C 2009, 113, 1560-1566
7. Gessner, W. Silikattechnik 1970, 21, 45-46
8. Thilo, E.; Wodtcke, F. Z. Anorg. Allg. Chem. 1958, 295, 246-261
9. Klein, W.; Jansen, M. Z. Anorg. Allg. Chem. 2008, 634, 1077-1081
10. Masse, R.; Tordjman, I.; Durif, A. Z. Kristallogr., Kristallgeom., Kristallphys., Kristallchem. 1976, 144, 76-81
11. Newsam, J. M.; Cheetham, A. K.; Tofield, B. C. Solid State Ionics 1980, 1, 377-393
12. Friebel, C.; Jansen, M. Z. Naturforsch., B: Anorg. Chem., Org. Chem. 1984, 39B, 739-743
13. Dinnebier, R. E.; Kowalevsky, A.; Reichert, H.; Jansen, M. Z. Kristallogr. 2007, 222, 420-426
14. Hu, X.; Hu, C. J. Solid State Chem. 2007, 180, 725
15. Hirono, T.; Koizumi, H.; Yamada, T.; Nishi, T. Thin Solid Films 1987, 149, L85-L88
16. Albrecht, T. A.; Stern, C. L.; Poeppelmeier, K. Inorg. Chem. 2007, 46, 1704-1708
17. Trimarchi, G.; Peng, H.; Im, J.; Freeman, A.; Cloet, V.; Raw, A.; Poeppelmeier, K.; Biswas, K.; Lany, S.; Zunger, A. Phys. Rev. B 2011, 84, 165116
18. Hirono, T.; Yamada, T. J. Appl. Phys. 1986, 59, 948
19. Bertolini, J. J. Emerg. Med. 1992, 10, 163-168
20. Segal, E. J. Chem. Health Saf. 2000, 7, 18-23
21. Peters, D.; Miethchen, R. J. Fluorine Chem. 1996, 79, 161-165
22. Harrison, W.; Nenoff, T.; Gier, T.; Stucky, G. Inorg. Chem. 1993, 32, 2437-2441
23. Perkins, J. D.; del Cueto, J. A.; Alleman, J. L.; Warmsingh, C.; Keyes, B. M.; Gedvilas, L. M.; Parilla, P. A.; To, B.; Reade y, D. W.; Ginley, D. S. Thin Solid Films 2002, 411, 152.
24. Perkins, J. D.; Paudel, T. R.; Zakutayev, A.; Ndione, P. F.; Parilla, P. A.; Young, D. L.; Ginley, D. S.; Zunger, A.; Perry, N. H.; Tang, Y.; Grayson, M.; Mason, T. O.; Bettinger, J. S.; Shi, Y.; Toney, M. F. Phys. Rev. B 2011, 84, 205207
25. Jade 2010, XRD Processing, Identification and Quantification; Materials Data, Inc., 2010.
26. APEX 2 v.4.1; Bruker Analytical X-ray Instruments, Inc.; 2011.
27. SAINT v.7.34a; Bruker Analytical X-ray Instruments, Inc.; 2011.
28. SMART Data Collection v.5.054; Bruker Analytical X-ray Instruments, Inc.; 2003.
29. SAINT Plus v.6.45a; Bruker Analytical X-ray Instruments, Inc.; 2003.
30. Stoe, Cie; IPDS Software. 1998
31. Sheldrick, G. Acta Crystallogr., Sect. A: Found. Crystallogr. 2008, A64, 10
32. Gelato, G.; Parthe, E. J. Appl. Crystallogr. 1987, 20, 4
33. Kubelka, P.; Munk, F. Z. Tech. Phys. 1931, 12, 593-601
34. Hwang, J.-H.; Kirkpatrick, K.; Mason, T.; Garboczi, E. Solid State Ionics 1997, 98, 93-104
35. Boukamp, B. A. University of Twente, The Netherlands/WisseQ, 1986-2005.
36. McLachlan, D.; Blaszkiewicz, M.; Newnham, R. J. Am. Ceram. Soc. 1990, 73, 2187-2203
37. Schroder, D. Semiconductor Material and Device Characterization; John Wiley and Sons: Hoboken, NJ, 2006.
38. Andrews, D.; Gianola, A.; Lineberger, W. J. Chem. Phys. 2002, 117, 4074
39. Shannon, R. Acta Crystallogr., Sect. A: Cryst. Phys., Diffr., Theor. Gen. Crystallogr. 1976, A32, 751-767
40. Osorio-Guillen, J.; Lany, S.; Barabash, S.; Zunger, A. Phys. Rev. Lett. 2006, 107203
41. Konta, R.; Kato, H.; Kobayashi, H.; Kudo, A. Phys. Chem. Chem. Phys. 2003, 5, 3061-3065