Reliability investigations of printed circuit boards

2nd 1998 IEMT/IMC Symposium

Volumn 1998-April, Issue , 1998, Pages 236-

  Ehrler, S ^a  

^a Hewlett Packard GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; MICROELECTRONICS; RELIABILITY; TIMING CIRCUITS;

BASE MATERIAL; INNER LAYER; PERFORMANCE MEASURE; RELIABILITY INVESTIGATIONS;

PRINTED CIRCUIT BOARDS;

EID: 84866036722     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEMTIM.1998.704628     Document Type: Conference Paper

References (0)