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Volumn , Issue , 2006, Pages 424-427
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Multiplexed CMOS sensor arrays for die stress mapping
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT MIRROR (CM);
DIE STRESS MAPPING;
IN-PLANE NORMAL STRESS;
MOSIS TINY CHIP;
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
FIELD EFFECT TRANSISTORS;
FINITE ELEMENT METHOD;
PIEZOELECTRIC DEVICES;
SHEAR STRESS;
SENSORS;
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EID: 84865441329
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ESSCIR.2006.307471 Document Type: Conference Paper |
Times cited : (31)
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References (17)
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