A 90-nm radiation hardened clock spine

IEEE Transactions on Nuclear Science

Volumn 59, Issue 4 PART 1, 2012, Pages 1020-1026

  Chellappa, Srivatsan ^a   Clark, Lawrence T ^a   Holbert, Keith E ^a  

^a Arizona State University   (United States)

Author keywords

Clock generation; radiation hardening by design; single event transients; single event upset

Indexed keywords

BROAD BEAMS; CLOCK GATING; CLOCK GENERATION; DESIGN CONTROL; LOW POWER; RADIATION HARDENING BY DESIGN; RADIATION-HARDENED; SINGLE EVENT TRANSIENTS; SINGLE EVENT UPSETS; TEST CHIPS;

CLOCK DISTRIBUTION NETWORKS; ERROR DETECTION; TRANSIENTS;

CLOCKS;

EID: 84865373943     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2012.2183647     Document Type: Article

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