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Volumn , Issue , 2011, Pages 283-286
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A technique for clustering individual defects from images of steel strips with periodical defects
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Author keywords
[No Author keywords available]
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Indexed keywords
BACKTRACKING ALGORITHM;
BEST VALUE;
CLUSTERING TECHNIQUES;
ONE-FACTOR;
PERIODIC PATTERN;
STEEL STRIP;
TEST ENVIRONMENT;
CLUSTERING ALGORITHMS;
COMPUTER VISION;
STRIP METAL;
SURFACE DEFECTS;
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EID: 84865364033
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (10)
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