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Volumn 15, Issue 4, 2012, Pages 16-21

Analyzing artifacts in the time domain waveform to locate wire faults

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED MEASUREMENT; CABLE LENGTH; CURRENT DETECTION; HIGH-VOLTAGES; INTERMITTENT FAULT; LOW ENERGIES; REAL WORLD DATA; SAFETY CONCERNS; TILT-ROTOR AIRCRAFTS; TIME DOMAIN REFLECTOMETRY; TIME-DOMAIN REFLECTOMETERS; TIME-DOMAIN WAVEFORMS; WAVE FORMS; WEAPONS SYSTEMS;

EID: 84865256889     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2012.6263978     Document Type: Article
Times cited : (28)

References (9)
  • 2
    • 84865227063 scopus 로고
    • Hp application note 62: Time domain reflectometry
    • Palo Alto, CA, Hewlett-Packard
    • "HP Application Note 62: Time domain reflectometry," TDR Fundamentals, Palo Alto, CA, Hewlett-Packard, p. 57, 1988.
    • (1988) TDR Fundamentals , pp. 57
  • 3
    • 0034482597 scopus 로고    scopus 로고
    • Managed aircraft wiring health directly relates to improved avionics performance
    • C. Teal and C. Satterlee, "Managed aircraft wiring health directly relates to improved avionics performance," in Proc. Digital Avionics Systems Conferences, 2000, vol. 1, pp. 3B6/1-3B6/6, 2000.
    • (2000) Proc. Digital Avionics Systems Conferences, 2000 , vol.1
    • Teal, C.1    Satterlee, C.2
  • 4
    • 61649101001 scopus 로고    scopus 로고
    • Detection and location of multiple wiring faults via time-frequency- domain reflectometry
    • Feb
    • E. Song, Y. Shin, P.E. Stone, J.Wang, T. Choe, J. Yook, and J. Park, "Detection and location of multiple wiring faults via time-frequency-domain reflectometry," IEEE Trans. Electrom. Compat., vol. 51, no. 1, pp. 131-138, Feb. 2009.
    • (2009) IEEE Trans. Electrom. Compat. , vol.51 , Issue.1 , pp. 131-138
    • Song, E.1    Shin, Y.2    Stone, P.E.3    Wang, J.4    Choe, T.5    Yook, J.6    Park, J.7
  • 6
    • 84865245248 scopus 로고    scopus 로고
    • Arc fault detection system
    • "Arc Fault Detection System." Astronics AES. [Online], Available: http://www.astronics.com/-images/test-solutions/Arc-Fault-Detection- System-Data-Sheet.pdf.
    • Astronics AES.
  • 8
    • 81055136626 scopus 로고    scopus 로고
    • A nondestructive high-voltage low-energy intermittent fault location system
    • M. Ballas, N. Locken, C. Parkey, and C. Hughes, "A nondestructive high-voltage low-energy intermittent fault location system," in Proc. IEEE AUTOTESTCON 2011, pp. 78-86.
    • Proc. IEEE AUTOTESTCON 2011 , pp. 78-86
    • Ballas, M.1    Locken, N.2    Parkey, C.3    Hughes, C.4
  • 9
    • 81055138955 scopus 로고    scopus 로고
    • Analyzing artifacts in the time domain waveform to locate wire faults
    • C. Parkey, C. Hughes, and N. Locken, "Analyzing artifacts in the time domain waveform to locate wire faults," in Proc. AUTOTESTCON 2011, pp. 131-138.
    • Proc. AUTOTESTCON 2011 , pp. 131-138
    • Parkey, C.1    Hughes, C.2    Locken, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.