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Japanese Journal of Applied Physics

Volumn 51, Issue 8 PART 4, 2012, Pages

Characterization of isolated individual single-walled carbon nanotube by electrochemical scanning tunneling microscopy

(4) Yasuda, Satoshi a,b Ikeda, Kouta a Yu, Li a Murakoshi, Kei a

a HOKKAIDO UNIVERSITY (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AU(111) SURFACES; ELECTROCHEMICAL CONTROL; ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPY; LOCAL DENSITY OF STATE; METALLIC NANOTUBES; NANO-METER SCALE; SEMI-CONDUCTING NANOTUBES; VAN HOVE SINGULARITIES;

SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN);

NANOTUBES;

EID: 84865211221 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.51.08KB06 Document Type: Article

Times cited : (6)

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