Correlation between Ti 2O 3 and oxygen absorption property of partially reduced TiO 2 (TiO 2-x)

Journal of Industrial and Engineering Chemistry

Volumn 18, Issue 5, 2012, Pages 1572-1576

  Chae, YoonKeun ^a   Park, JinWon ^a   Mori, Shinsuke ^b   Suzuki, Masaaki ^b  

^a Yonsei University   (South Korea)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Hydrogen plasma; Oxygen absorption; Reduction; Ti 2O 3; TiO 2

Indexed keywords

HEATING TEMPERATURES; HYDROGEN PLASMA TREATMENTS; HYDROGEN PLASMAS; OXYGEN ABSORPTION; PARTIAL REDUCTION; PLASMA EFFECTS; TIO;

GAS CHROMATOGRAPHY; PLASMA APPLICATIONS; REDUCTION; VOLTAGE DIVIDERS; X RAY DIFFRACTION;

TITANIUM DIOXIDE;

EID: 84865102876     PISSN: 1226086X     EISSN: 22345957     Source Type: Journal    
DOI: 10.1016/j.jiec.2012.01.049     Document Type: Article

References (21)

1. Kim Seung-Soo, Lee Hwaung, Na Byung-Ki, Song Hyung Keun Catalysis Today 2004, 89:193-200.
2. Belmonte T., Thiébaut J.M., Michel H., Cardoso R.P., Maliska A. Journal of Vacuum Science and Technology 2002, 20/4:1353.
3. Aarthi T., Madras Giridhar Catalysis Communications 2008, 9:630-634.
4. M. Kase, I. Moriya, T. Yotsumoto, H. Taoda, Japanese Patent No. 2004-137087, May 13 (2004) (in Japanese).
5. H. Taoda, E. Watawabe, T. Nonami, M. Fukuya, Japanese Patent No. 3288265, March 15 (2002) (in Japanese).
6. Yoong L.S., Chong F.K., Dutta Binay K. Energy 2009, 34:1652-1661.
7. Yu Changlin, Yu Jimmy, Zhou Wanqin, Yang Kai Catalysis Letters 2010, 140:172-183.
8. Bozorgtabar M., Rahimipour M., Salehi M. Surface Engineering 2010, 26:422-427.
9. Lefèvre G., Fédoroff M., čerović L.J. Surface Engineering 2008, 24:272-275.
10. Moon Jaehyun, Park Jin-Ah, Lee Su-Jae, Zyung Taehyoung, Kim Il-Doo Sensors and Actuators B: Chemical 2010, 149:301-305.
11. Park Hun, Kim Woong-Rae, Jeong Hyo-Tae, Lee Jae-Joon, Kim Ho-Gi, Choi Won-Youl Solar Energy Materials and Solar Cells 2011, 95:184-189.
12. Henderson Michael A., Epling William S., perkins Craig L., Peden Charles H.F. Journal of Physical Chemistry B 1999, 103:5328-5337.
13. Akira Izumi, Tomoya Ueno, Yasuo Miyazaki, Hiroaki Oizumi, Iwao Nishiyama Thin Solid Films 2008, 516:853-855.
14. Belousov V.M., Vasylyev M.A., Lyashenko L.V., Yu Vilkova N., Nieuwenhuys B.E. Chemical Engineering Journal 2003, 91:143-150.
15. Ulrike Diebold Surface Science Reports 2003, 48:53.
16. Chae Y.K., Mori S., Suzuki M. Thin Solid Film 2009, 517:4260-4263.
17. Ménétrey M., Markovits A., Minot C. Journal of Molecular Structure (THEOCHEM) 2007, 808:71-79.
18. Thomas Bredow, Gianfranco Pacchioni Chemical Physics Letters 2002, 355:417-423.
19. Göpel W., Rocker G., Freierabend R. Physical Reviews B 1983, 28:3427.
20. Mckay Jeffrey M., Henrich Victor E. Surface Science 1984, 137:463-472.
21. Uner D., Tapan N.A., özen I., üner M. Catalysis A-General 2003, 251:225-234.