Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2012, Pages 146-151

  Moon, Thomas ^a   Tzou, Nicholas ^a   Wang, Xian ^a   Choi, Hyun ^b   Chatterjee, Abhijit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b SAMSUNG Electronics   (South Korea)

Author keywords

Analog to digital converters; jitter noise; Nonuniform periodic sampling; phase noise; PRBS; signal representation

Indexed keywords

ANALOG TO DIGITAL CONVERTERS; JITTER NOISE; PERIODIC SAMPLING; PRBS; SIGNAL REPRESENTATIONS;

ALGORITHMS; HARDWARE; INTEGRATED CIRCUIT TESTING; JITTER; PHASE NOISE; SIGNAL ANALYSIS; SIGNAL RECONSTRUCTION;

SIGNAL SAMPLING;

EID: 84864976726     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2012.6231094     Document Type: Conference Paper

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